Junction Resistivity of Carrier-Selective Polysilicon on Oxide Junctions and Its Impact on Solar Cell Performance

verfasst von
Michael Rienacker, Marcel Bossmeyer, Agnes Merkle, Udo Romer, Felix Haase, Jan Krugener, Rolf Brendel, Robby Peibst
Abstract

We investigate the junction resistivity of high quality carrier selective polysilicon on oxide (POLO) junctions with the transfer length method. We demonstrate n + POLO junctions with a saturation current density J c, poly of 6.2 fA/cm 2 and junction resistivity p c of 0.6 mΩcm 2 , counterdoped n + POLO junctions with 2.7 fA/cm 2 and 1.3 mΩcm 2 , and p + POLO junctions with 6.7 fA/cm 2 and 0.2 mΩcm 2 . Such low junction resistivities and saturation current densities correspond to excellent selectivities of up to 16.2 and imply a contribution of only a few mΩcm 2 to the total series resistance of the cell, enabling an efficiency potential larger than 26 %, which was estimated by numerical device simulations. We demonstrate experimentally a back-junction back contacted solar cell with p-type and n-type POLO junctions with an efficiency of 23.9 %. This efficiency is the largest reported so far for cells with polysilicon junctions for both contacts and it is limited by the passivation of undoped regions.

Organisationseinheit(en)
Institut für Materialien und Bauelemente der Elektronik
Institut für Festkörperphysik
Externe Organisation(en)
University of New South Wales (UNSW)
Institut für Solarenergieforschung GmbH (ISFH)
Typ
Artikel
Journal
IEEE Journal of Photovoltaics
Band
7
Seiten
11-18
Anzahl der Seiten
8
ISSN
2156-3381
Publikationsdatum
01.2017
Publikationsstatus
Veröffentlicht
Peer-reviewed
Ja
ASJC Scopus Sachgebiete
Elektronische, optische und magnetische Materialien, Physik der kondensierten Materie, Elektrotechnik und Elektronik
Ziele für nachhaltige Entwicklung
SDG 7 – Erschwingliche und saubere Energie
Elektronische Version(en)
https://doi.org/10.1109/PVSC.2017.8366491 (Zugang: Geschlossen)
https://doi.org/10.1109/JPHOTOV.2016.2614123 (Zugang: Geschlossen)